Jenny lauper

Atomic Force Microscopy

Article on the subject of Atomic Force Microscopy, force microscopy and Patch Clamping

Atomic Force Microscopy, also known as Scanning force microscopy, is a high resolution scanning probe microscopy. It offers optimum level of imaging function with a resolution of fractions of a nanometer, which is over 1000 times more effective than the optical diffraction limit.

1.      Application of Atomic force Microscopy in Ophthalmology or Contact Lens Manufacturing:

AFM’s optimum quality resolution makes it possible to image and measure the features on the order of as less as a few nanometers. AFM has the capability of characterizing contact lenses in their characteristic liquid environment. A notable benefit of this technique is that it can be used to examine soft contact lenses’ surfaces in a hydrated as well as a dehydrated state.

Besides, AFM is one of the safest techniques applied in contact lens manufacturing, as it characterizes the contact lenses without causing any kind of damage.

2.      Application of Atomic Force Microscopy in food science:

Atomic force microscopy offers an effective way for the detection of nanoscale structural information. AFM can help a great deal in critical insights on food properties. Analysis done through AFM can be helpful in illustrating property changes taking place in food during processing and storage. This in turn will give a more comprehensive knowledge of the food properties at macromolecular levels, thereby helping to improve the technologies associated with food processing and storage.

3.      Application of Atomic Force Microscopy in Biology:

AFM can be an ideal way to learn about the subcellular structures and biomolecules. Since the atomic force microscope, in a physiological environment, can image the 3-D structure of a biological specimen, it makes it possible to monitor real-time physiological and biochemical processes at a resolution that is similar to that obtained by using an electron microscope.

Modes of operation:

AFMs are very versatile and as a result they are applied to a large number of research topics and have also been modified to suit various applications. Some of these include “tapping mode” AFM, Phase Imaging and Force Modulation.

Article Tags: Atomic Force Microscopy, Atomic Force, Force Microscopy

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